基于反射变换成像技术探究姊妹线笔痕特征
孙林杰⊃1; , 陈维娜, 郑宇, 刘宁
The characteristics of sister lines pen marks were studied based on Reflectance Transformation Imaging
SUN Linjie¹, CHEN Weina¹, ZHENG Yu², LIU Ning³
光散射学报
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2024, (4): 479
-488
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DOI: 10.13883/j.issn1004-5929.202404014
