Development of Raman Spectroscopy for the Determination of Oxidation Stresses in Oxidation Scales Formed on Interconnectors

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Chinese Journal of Light Scattering ›› 2015, Vol. 27 ›› Issue (4) : 342-349. DOI: 10.13883/j.issn1004-5929.201504007

Development of Raman Spectroscopy for the Determination of Oxidation Stresses in Oxidation Scales Formed on Interconnectors

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{{article.zuoZheEn_L}}. {{article.title_en}}. {{journal.qiKanMingCheng_EN}}. 2015, 27(4): 342-349 https://doi.org/10.13883/j.issn1004-5929.201504007

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