


Fabrication of Silicon Nanocrystals by Low Temperature Eutectic Alloying and Their Characterization
Fabrication of Silicon Nanocrystals by Low Temperature Eutectic Alloying and Their Characterization
Taking advantage of the eutectic points of Au/Sb and Au/Si at low temperatures, silicon nanocrystals doped with Sb atoms are fabricated on the surface of silicon wafers after an alloying reaction around 400 ℃. Scanning electron microscopy demonstrates that there exist craters in the shape of an inverted pyramid and large amount of nanostructures inside craters on the wafer surface due to Au/Si alloying reactions. Raman scattering spectroscopy verifies that these nanograins largely possess a crystal-like lattice structure. Secondary ion mass spectroscopy reveals that the doping concentration of Sb in Si exceeds 2×1018 cm-3, surpassing the solid solubility of Sb in the bulk silicon crystal. This growth method is easy to implement with a low thermal budget, which potentially provides it the good compatibility with other micro/nano fabrication processes.
silicon nanocrystals / eutectic point / Raman Scattering spectroscopy / secondary ion mass spectroscopy {{custom_keyword}} /
/
〈 |
|
〉 |