Fabrication of Silicon Nanocrystals by Low Temperature Eutectic Alloying and Their Characterization

Chinese Journal of Light Scattering ›› 2017, Vol. 29 ›› Issue (4) : 320. DOI: 10.13883/j.issn1004-5929.201704006

Fabrication of Silicon Nanocrystals by Low Temperature Eutectic Alloying and Their Characterization

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Abstract

Taking advantage of the eutectic points of Au/Sb and Au/Si at low temperatures, silicon nanocrystals doped with Sb atoms are fabricated on the surface of silicon wafers after an alloying reaction around 400 ℃. Scanning electron microscopy demonstrates that there exist craters in the shape of an inverted pyramid and large amount of nanostructures inside craters on the wafer surface due to Au/Si alloying reactions. Raman scattering spectroscopy verifies that these nanograins largely possess a crystal-like lattice structure. Secondary ion mass spectroscopy reveals that the doping concentration of Sb in Si exceeds 2×1018 cm-3, surpassing the solid solubility of Sb in the bulk silicon crystal. This growth method is easy to implement with a low thermal budget, which potentially provides it the good compatibility with other micro/nano fabrication processes.

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silicon nanocrystals / eutectic point / Raman Scattering spectroscopy / secondary ion mass spectroscopy

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. Fabrication of Silicon Nanocrystals by Low Temperature Eutectic Alloying and Their Characterization. Chinese Journal of Light Scattering. 2017, 29(4): 320 https://doi.org/10.13883/j.issn1004-5929.201704006

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