The characteristics of sister lines pen marks were studied based on Reflectance Transformation Imaging

SUN Linjie¹, CHEN Weina¹, ZHENG Yu², LIU Ning³

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Chinese Journal of Light Scattering ›› 2024, Vol. 36 ›› Issue (4) : 479-488. DOI: 10.13883/j.issn1004-5929.202404014

The characteristics of sister lines pen marks were studied based on Reflectance Transformation Imaging

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{{article.zuoZheEn_L}}. {{article.title_en}}. {{journal.qiKanMingCheng_EN}}. 2024, 36(4): 479-488 https://doi.org/10.13883/j.issn1004-5929.202404014

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