A Review of the Application of Compton Backscattering in Wall Defect Detection Based on Compton Backscattering

CHEN Siyu, YANG Jianbo, SUN Wanyi, HUANG Xin, ZHANG Jiang, MO Site

PDF(933 KB)
Chinese Journal of Light Scattering ›› 2025, Vol. 37 ›› Issue (4) : 527-533. DOI: 10.13883/j.issn1004-5929.202504002

A Review of the Application of Compton Backscattering in Wall Defect Detection Based on Compton Backscattering

    {{javascript:window.custom_author_en_index=0;}}
  • {{article.zuoZhe_EN}}
Author information +
History +

HeighLight

{{article.keyPoints_en}}

Abstract

{{article.zhaiyao_en}}

Key words

Cite this article

EndNote

Ris (Procite)

Bibtex

Download Citations
{{article.zuoZheEn_L}}. {{article.title_en}}. {{journal.qiKanMingCheng_EN}}. 2025, 37(4): 527-533 https://doi.org/10.13883/j.issn1004-5929.202504002

References

Publishing order | Descend order by publishing year | Descend order by cited within

References

{{article.reference}}

Funding

RIGHTS & PERMISSIONS

{{article.copyrightStatement_en}}
{{article.copyrightLicense_en}}
PDF(933 KB)

Accesses

Citation

Detail
Sections
Recommended
Copyright © Chinese Journal of Light Scattering
Tel: 86-028-85418067　
Fax: 86-028-85418067　
E-mail: cjls@scu.edu.cn （备用：cjls@qq.com）
Powered by Beijing Magtech Co. Ltd.

/

〈 〉