The Simulation Research of Total-Reflection X-Ray Fluorescence Analysis Technology Applied in Measurement of Galvanized Sheet Layer
刘宗赣1*，孔建益1，徐 巍1，开岗生2，王兴东1
The Journal of Light Scattering . 2017, (3): 285 .  DOI: 10.13883/j.issn1004-5929.201703017

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