The characteristics of sister lines pen marks were studied based on Reflectance Transformation Imaging
SUN Linjie⊃1;, CHEN Weina⊃1;, ZHENG Yu⊃2;, LIU Ning⊃3;
Chinese Journal of Light Scattering . 2024, (4): 479 -488 .  DOI: 10.13883/j.issn1004-5929.202404014

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