Characterization of Optical Properties of Wide Band Gap Semiconductor Thin Film with the Combination of Ellipsometry and Infrared Spectrum
谢灯； 丘志仁； 万玲玉； TIN Chin-che； 梅霆； 冯哲川
The Journal of Light Scattering . 2016, (3): 214 -219 .  DOI: 10.13883/j.issn1004-5929.201603004

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